SJ 3235-1989 带状锆铝吸气剂
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基本信息
| 标准名称： | 带状锆铝吸气剂 |
| 英文名称： | Ribbon getter made of Zirconium and Aluminium |
| 中标分类： | 综合 >> 标准化管理与一般规定 >> 技术管理 |
| 发布日期： | 1989-03-20 |
| 实施日期： | 1989-03-25 |
| 首发日期： | 1900-01-01 |
| 作废日期： | 1900-01-01 |
| 出版日期： | 1900-01-01 |
| 页数： | 7页 |
适用范围
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前言
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目录
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引用标准
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所属分类： 综合 标准化管理与一般规定 技术管理
下载地址: 点击此处下载
【英文标准名称】:Agriculturalandforestrymachinery-Pedestriancontrolledtractorswithmountedrotarycultivators,motorhoes,motorhoeswithdrivewheel(s)-Safety;GermanversionEN709:1997+A4:2009
【原文标准名称】:农林机械.安装旋转滚筒刀耕耘机、机动中耕锄和带驱动轮机动中耕锄的非专业人员操作的拖拉机.安全性.德文版本EN709-1997+A4-2009
【标准号】:DINEN709-2010
【标准状态】:作废
【国别】:德国
【发布日期】:2010-09
【实施或试行日期】:2010-09-01
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:农业机械;农用拖拉机;农业;解剖学;配料;制动器;间隙;燃烧;通信;触点;封盖物;切削;危险区域;定义;设计;易达区域;电线;人类工效学;废气;爆炸危险;火灾危险;林业;图形符号;手动的;手柄轴;自行车车把;搬运;危害;热学;锄;吸入;机械;作标记;测量;测量技术;机械卷边连接;铣刀;具有驱动轮的电动锄;噪声;噪声(环境的);使用条件;操作元件;操作说明书;保护覆盖层;保护设备;安全;安全工程;安全措施;机械安全;安全要求;剪切;滑动;土地耕作;整地机具;规范(验收);起动装置;转向力;转向器的安装;绊跌;表面;温度;试验设备;试验;工具;拖拉机;用户信息;振动;手扶拖拉机;警告符号
【英文主题词】:Agriculturalmachines;Agriculturaltractors;Agriculture;Anatomy;Batching;Brakes;Clearances;Combustion;Communication;Contact;Covers;Cutting;Dangerzones;Definitions;Design;Easy-reacharea;Electricalcords;Ergonomics;Exhaustgases;Explosionhazard;Firehazards;Forestry;Graphicsymbols;Handoperated;Handleshafts;Handlebars;Handling;Hazards;Heat;Hoes;Inhalation;Machines;Marking;Measurement;Measuringtechniques;Mechanicalcrimping;Millingcutters;Motorhoewithdrivingwheels;Noise;Noise(environmental);Operatingconditions;Operatingelements;Operatinginstructions;Protectioncoverings;Protectiondevices;Safety;Safetyengineering;Safetymeasures;Safetyofmachinery;Safetyrequirements;Shearing;Slipping;Soilcultivation;Soil-workingequipment;Specification(approval);Startingdevices;Steeringforce;Steeringinstallations;Stumble;Surfaces;Temperature;Testequipment;Testing;Tools;Tractors;Userinformation;Vibration;Walkingtractors;Warningsymbols
【摘要】:
【中国标准分类号】:
【国际标准分类号】:65_060_20
【页数】:46P;A4
【正文语种】:德语
【英文标准名称】:StandardGuidefortheMeasurementofSingleEventPhenomena(SEP)InducedbyHeavyIonIrradiationofSemiconductorDevices
【原文标准名称】:半导体器件重离子照射感应产生的单件信号现象的测量标准指南
【标准号】:ASTMF1192-2000(2006)
【标准状态】:现行
【国别】:
【发布日期】:2000
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:SEB;SEE;SEFI;SEGR;SEL;SEP;SEPcrosssection;SEU;singleevent;singleeventeffect;singleeventphenomena;singleeventupset;spaceenvironment
【摘要】:Manymodernintegratedcircuits,powertransistors,andotherdevicesexperienceSEPwhenexposedtocosmicraysininterplanetaryspace,insatelliteorbitsorduringashortpassagethroughtrappedradiationbelts.ItisessentialtobeabletopredicttheSEPrateforaspecificenvironmentinordertoestablishpropertechniquestocountertheeffectsofsuchupsetsinproposedsystems.AsthetechnologymovestowardhigherdensityICs,theproblemislikelytobecomeevenmoreacute.ThisguideisintendedtoassistexperimentersinperforminggroundteststoyielddataenablingSEPpredictionstobemade.1.1Thisguidedefinestherequirementsandproceduresfortestingintegratedcircuitsandotherdevicesfortheeffectsofsingleeventphenomena(SEP)inducedbyirradiationwithheavyionshavinganatomicnumberZ2.Thisdescriptionspecificallyexcludestheeffectsofneutrons,protons,andotherlighterparticlesthatmayinduceSEPviaanothermechanism.SEPincludesanymanifestationofupsetinducedbyasingleionstrike,includingsofterrors(oneormoresimultaneousreversiblebitflips),harderrors(irreversiblebitflips),latchup(permanenthighconductingstate),transientsinducedincombinatorialdeviceswhichmayintroduceasofterrorinnearbycircuits,powerfieldeffecttransistor(FET)burn-outandgaterupture.Thistestmaybeconsideredtobedestructivebecauseitofteninvolvestheremovalofdevicelidspriortoirradiation.Bitflipsareusuallyassociatedwithdigitaldevicesandlatchupisusuallyconfinedtobulkcomplementarymetaloxidesemiconductor,(CMOS)devices,butheavyioninducedSEPisalsoobservedincombinatoriallogicprogrammablereadonlymemory,(PROMs),andcertainlineardevicesthatmayrespondtoaheavyioninducedchargetransient.PowertransitorsmaybetestedbytheprocedurecalledoutinMethod1080ofMILSTD750.1.2TheproceduresdescribedherecanbeusedtosimulateandpredictSEParisingfromthenaturalspaceenvironment,includinggalacticcosmicrays,planetarytrappedionsandsolarflares.Thetechniquesdonot,however,simulateheavyionbeameffectsproposedformilitaryprograms.TheendproductofthetestisaplotoftheSEPcrosssection(thenumberofupsetsperunitfluence)asafunctionofionLET(linearenergytransfer,orionizationdepositedalongtheion''spaththroughthesemiconductor).Thisdatacanbecombinedwiththesystem''sheavyionenvironmenttoestimateasystemupsetrate.1.3AlthoughprotonscancauseSEP,theyarenotincludedinthisguide.AseparateguideaddressingprotoninducedSEPisbeingconsidered.1.4ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisguide.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:11P.;A4
【正文语种】:
【原文标准名称】:农林机械.安装旋转滚筒刀耕耘机、机动中耕锄和带驱动轮机动中耕锄的非专业人员操作的拖拉机.安全性.德文版本EN709-1997+A4-2009
【标准号】:DINEN709-2010
【标准状态】:作废
【国别】:德国
【发布日期】:2010-09
【实施或试行日期】:2010-09-01
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:农业机械;农用拖拉机;农业;解剖学;配料;制动器;间隙;燃烧;通信;触点;封盖物;切削;危险区域;定义;设计;易达区域;电线;人类工效学;废气;爆炸危险;火灾危险;林业;图形符号;手动的;手柄轴;自行车车把;搬运;危害;热学;锄;吸入;机械;作标记;测量;测量技术;机械卷边连接;铣刀;具有驱动轮的电动锄;噪声;噪声(环境的);使用条件;操作元件;操作说明书;保护覆盖层;保护设备;安全;安全工程;安全措施;机械安全;安全要求;剪切;滑动;土地耕作;整地机具;规范(验收);起动装置;转向力;转向器的安装;绊跌;表面;温度;试验设备;试验;工具;拖拉机;用户信息;振动;手扶拖拉机;警告符号
【英文主题词】:Agriculturalmachines;Agriculturaltractors;Agriculture;Anatomy;Batching;Brakes;Clearances;Combustion;Communication;Contact;Covers;Cutting;Dangerzones;Definitions;Design;Easy-reacharea;Electricalcords;Ergonomics;Exhaustgases;Explosionhazard;Firehazards;Forestry;Graphicsymbols;Handoperated;Handleshafts;Handlebars;Handling;Hazards;Heat;Hoes;Inhalation;Machines;Marking;Measurement;Measuringtechniques;Mechanicalcrimping;Millingcutters;Motorhoewithdrivingwheels;Noise;Noise(environmental);Operatingconditions;Operatingelements;Operatinginstructions;Protectioncoverings;Protectiondevices;Safety;Safetyengineering;Safetymeasures;Safetyofmachinery;Safetyrequirements;Shearing;Slipping;Soilcultivation;Soil-workingequipment;Specification(approval);Startingdevices;Steeringforce;Steeringinstallations;Stumble;Surfaces;Temperature;Testequipment;Testing;Tools;Tractors;Userinformation;Vibration;Walkingtractors;Warningsymbols
【摘要】:
【中国标准分类号】:
【国际标准分类号】:65_060_20
【页数】:46P;A4
【正文语种】:德语
【英文标准名称】:StandardGuidefortheMeasurementofSingleEventPhenomena(SEP)InducedbyHeavyIonIrradiationofSemiconductorDevices
【原文标准名称】:半导体器件重离子照射感应产生的单件信号现象的测量标准指南
【标准号】:ASTMF1192-2000(2006)
【标准状态】:现行
【国别】:
【发布日期】:2000
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:SEB;SEE;SEFI;SEGR;SEL;SEP;SEPcrosssection;SEU;singleevent;singleeventeffect;singleeventphenomena;singleeventupset;spaceenvironment
【摘要】:Manymodernintegratedcircuits,powertransistors,andotherdevicesexperienceSEPwhenexposedtocosmicraysininterplanetaryspace,insatelliteorbitsorduringashortpassagethroughtrappedradiationbelts.ItisessentialtobeabletopredicttheSEPrateforaspecificenvironmentinordertoestablishpropertechniquestocountertheeffectsofsuchupsetsinproposedsystems.AsthetechnologymovestowardhigherdensityICs,theproblemislikelytobecomeevenmoreacute.ThisguideisintendedtoassistexperimentersinperforminggroundteststoyielddataenablingSEPpredictionstobemade.1.1Thisguidedefinestherequirementsandproceduresfortestingintegratedcircuitsandotherdevicesfortheeffectsofsingleeventphenomena(SEP)inducedbyirradiationwithheavyionshavinganatomicnumberZ2.Thisdescriptionspecificallyexcludestheeffectsofneutrons,protons,andotherlighterparticlesthatmayinduceSEPviaanothermechanism.SEPincludesanymanifestationofupsetinducedbyasingleionstrike,includingsofterrors(oneormoresimultaneousreversiblebitflips),harderrors(irreversiblebitflips),latchup(permanenthighconductingstate),transientsinducedincombinatorialdeviceswhichmayintroduceasofterrorinnearbycircuits,powerfieldeffecttransistor(FET)burn-outandgaterupture.Thistestmaybeconsideredtobedestructivebecauseitofteninvolvestheremovalofdevicelidspriortoirradiation.Bitflipsareusuallyassociatedwithdigitaldevicesandlatchupisusuallyconfinedtobulkcomplementarymetaloxidesemiconductor,(CMOS)devices,butheavyioninducedSEPisalsoobservedincombinatoriallogicprogrammablereadonlymemory,(PROMs),andcertainlineardevicesthatmayrespondtoaheavyioninducedchargetransient.PowertransitorsmaybetestedbytheprocedurecalledoutinMethod1080ofMILSTD750.1.2TheproceduresdescribedherecanbeusedtosimulateandpredictSEParisingfromthenaturalspaceenvironment,includinggalacticcosmicrays,planetarytrappedionsandsolarflares.Thetechniquesdonot,however,simulateheavyionbeameffectsproposedformilitaryprograms.TheendproductofthetestisaplotoftheSEPcrosssection(thenumberofupsetsperunitfluence)asafunctionofionLET(linearenergytransfer,orionizationdepositedalongtheion''spaththroughthesemiconductor).Thisdatacanbecombinedwiththesystem''sheavyionenvironmenttoestimateasystemupsetrate.1.3AlthoughprotonscancauseSEP,theyarenotincludedinthisguide.AseparateguideaddressingprotoninducedSEPisbeingconsidered.1.4ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisguide.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:11P.;A4
【正文语种】: